X-ray Fluorescence (XRF) and Inductively Coupled Plasma (ICP) Spectroscopy

Arkema Analytical Solutions offers advanced elemental analysis capabilities such as wavelength dispersive X-ray fluorescence (XRF or WDXRF) and inductively coupled plasma optical emission spectroscopy (ICP or ICP-OES).  These analytical techniques are powerful tools for detecting and quantifying the elemental composition of:

• Additives, fillers and pigments
• Inorganic components in paints
• Residues
• Ceramics and clays
• Metals and alloys
• Cement, clinker and fly ash
• Catalysts and zeolites
• Glass
• Biological and organic compounds

In wavelength dispersive X-ray fluorescence spectroscopy a high-power incident X-ray beam produces X-ray emissions characteristic of atoms present within an exposed sample.  Diffraction crystals subsequently focus X-rays of specific wavelengths onto a detector.  The X-ray intensities are proportional to elemental concentrations, allowing quantification to part per million (ppm) levels.  Standardless or semi-quantitative approaches permit estimation of concentrations in as little as several minutes without the use of standards, with accuracy around 10-20% relative.  If available, standards can be used to build calibration curves to allow measurements with accuracies better than 1% relative.  Elements lighter than fluorine cannot be detected.

Inductively coupled plasma optical emission spectroscopy uses a high-energy plasma to dissociate a sample into its constituent atoms or ions, which emit characteristic UV or visible lines that are measured by a CCD detector.  Most elements in the periodic table can be quantified with concentrations ranging from parts per billion to percent levels through calibration with high-purity calibration standards.